The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 1995
Filed:
Nov. 03, 1993
Applicant:
Inventor:
Wei Chang, Lisle, IL (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
25036304 ;
Abstract
Apparatus for producing attenuation data for compensating a radionuclide emission imaging system. A single photon emission computed tomography (SPECT) system includes a radiation source disposed across the field of view from a detector portion and offset from a diameter through the center of the field of view intersecting a center of the detector portion. The radiation source and detector thereby define an asymmetrical radiation pattern that enlarges an attenuation field of view to provide a more thorough sampling of an object in the field of view.