The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 1995
Filed:
Feb. 28, 1994
Paul A Kildal-Brandt, Webster, NY (US);
Thomas A Weber, Rochester, NY (US);
Eastman Kodak Company, Rochester, NY (US);
Abstract
A method of assaying analytes using a rate procedure is described where the change in density over time has a variable rate. The method features the steps of depositing the sample onto a dried slide-like test element, making an initial rate reading during an early time window, using the initial rate readings in a comparison study with rates from known low and high concentration results to predict whether the sample rate will be sufficiently low as to be ascertainable during a later time window or not, and then calculating a rate of reaction and concentration during either the early time window or the early time window with a portion of the later time window, respectively. To avoid the possibility of a consistent bias, the initial rate readings are used directly in the comparison study without first calculating a concentration, by comparing the initial rate reading of a sample against known rates corresponding to samples with low and high concentrations to determine the length of the time window to be used in the rate calculation.