The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 1995
Filed:
Feb. 16, 1994
Ryohei Yabe, Katsuta-shi, Ibaraki-ken, JP;
Shinichi Sakuraba, 68199 Mannheim, DE;
Masaaki Kurimura, Ibaraki, JP;
Yasuaki Kojima, Katsuta-shi, Ibaraki-ken, JP;
Other;
Abstract
In a stained particle analyzing method and apparatus for staining a test sample containing suspended particles, shooting an image of the stained sample, and classifying the particles and computing the density from the shot image of the sample, the sample, which may not be analyzed precisely, is detected before the start of an image analyzing process. Only the sample, which will be analyzed precisely, is stained and subjected to the image analysis. Color information of the sample before the staining is detected and stored. Color information of an image of the sample shot after the staining is compensated based on the color information of the sample detected before the staining. The sort and density of the particles are classified and computed on the basis of the image after the color compensation.