The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1995
Filed:
Mar. 10, 1993
Kenton J Lynne, Rochester, MN (US);
Nicholas Samra, Austin, TX (US);
Thomas M Walker, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and system in a data processing system for managing a hierarchical error diagnostic system having a plurality of diagnostic modules for diagnosing a component failure within a target system having a predetermined group of components within each of a plurality of hierarchical levels. After the identification of selected hierarchical levels within the target system, and identification of the components within each hierarchical level, a first blackboard data storage area is initialized for utilization during a diagnostic session. Thereafter, a diagnostic analysis of a first predetermined group of components within a first selected hierarchical level is initiated. The diagnostic analysis utilizes the first blackboard data storage area and multiple diagnostic modules assigned to diagnose the components within the first selected hierarchical level. Upon conclusion of the diagnostic analysis, a diagnostic result is determined from selected information learned during the first diagnostic analysis. In preparation for a second diagnostic analysis of a second group of components in a second hierarchical level, which were selected in response to a result from the initial diagnostic analysis, a second blackboard data storage area is initialized utilizing selected information learned from the initial diagnostic analysis. Thereafter, a second diagnostic analysis of a second predetermined group of components within a second selected hierarchical level is automatically initiated. The second diagnostic analysis utilizes selected information learned during the initial diagnostic session, which is stored within the second blackboard data storage area during initialization, and multiple diagnostic modules within the second selected hierarchical level.