The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1995
Filed:
Jul. 30, 1993
John D Kaewell, Jr, Bensalem, PA (US);
David M Cooley, Upper Darby, PA (US);
Hughes Aircraft Company, Los Angeles, CA (US);
Abstract
An internal bit error rate (BER) test capability is built into the analog channel unit of a digital cellular base station. This test capability is controlled by the mobile telephone switching office (MTSO) to automatically perform BER measurements. The analog channel unit with this integrated function performs random sequence generation, continuous frequency shift keying (FSK) modulation, FSK random sequence acquisition, FSK demodulation and bit error tallying. The BER test functions built into the analog channel unit allow the tests to be performed via remote control from an operations and maintenance center of the MTSO. Having the BER test functions built into the analog channel unit reduces the number of physical interfaces which the analog channel unit has to support.