The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1995
Filed:
Jul. 06, 1993
Robert M Perchak, Dayton, OH (US);
Other;
Abstract
Methods and apparatus for measuring the lateral displacement and changes in the lateral dimension of thin long objects, particularly filament materials such as wire or various fibers. The material may move quasi-statically or at a high rate of speed. The simplest embodiment of this invention utilizes a light source such as an incandescent lamp, a laser, a light emitting diode, etc., to produce a collimated beam of light. The light traverses the sample region and impinges on a detector including least two precisely separated photosensors arranged at a predetermined angle to the object to monitor and/or measure changes in lateral dimension and displacement detection. Displacement information which can be derived from the method and apparatus can be utilized to determine the vibration and also the tension in a monitored filament or the like. A beam splitter can be used to produce multiple output beams directed to separate detectors.