The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 1995

Filed:

Aug. 31, 1993
Applicant:
Inventor:

Toshiyuki Koreeda, Kagoshima, JP;

Assignees:

Fujitsu Limited, Kawasaki, JP;

Kyushu Fujitsu Electronics Limited, Kagoshima, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03K / ; H03K / ;
U.S. Cl.
CPC ...
326 33 ; 326 78 ; 326 67 ; 326 26 ;
Abstract

A semiconductor integrated circuit device has a first ground to which a first circuit is connected and whose level is fluctuate due to noise and a second ground to which a second circuit, which provides an output to the first circuit, is connected and whose level is stable. The semiconductor integrated circuit device includes a fluctuation detecting unit for detecting a fluctuation in the level of the first ground according to the level of the second ground serving as a reference; and a level controlling unit for controlling the level of the output of the second circuit, to cancel the fluctuation detected by the fluctuation detecting unit. The semiconductor integrated circuit device detects a fluctuation in the level of the first ground, which is easily affected by noise, according to the level of the second ground, which is stable, and controls the level of the output of the second circuit, to cancel the detected fluctuation. Consequently, this semiconductor integrated circuit device reduces the influence of noise and prevents malfunctions.


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