The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1995
Filed:
Jul. 12, 1994
Applicant:
Inventor:
Daniel J Burns, Rome, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324765 ; 324537 ; 437-8 ; 257 48 ;
Abstract
A method is disclosed for testing or screening metal or polysilicon conductors and contacts on microelectronic devices that it uses a modified design layout for individual logic gates to enable high current density testing of all such elements used in the final functional circuit. The method uses a special metal pattern adding metal conductor paths to enable high current testing of normal conductors and contacts at an intermediate point during fabrication. The metal layer is patterned a second time to remove the high current paths and enable functional operation. This allows burn-in and screen testing to be performed at higher current densities than would otherwise be possible.