The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1995
Filed:
Dec. 24, 1992
Frederick W Selley, Kokomo, IN (US);
Gary N Denton, Kokomo, IN (US);
David A Copp, Sharpsville, IN (US);
John D Vote, Kokomo, IN (US);
Timothy B Garrison, Tipton, IN (US);
Delco Electronics Corp., Kokomo, IN (US);
Abstract
Apparatus for testing integrated circuit packages has a test circuit, a socket for receiving a standard circuit representing the packages being tested, and a special contact assembly for coupling to the packages being tested. Two sets of contacts in the assembly are permanently connected to the socket and the test circuit respectively, and one set is movable to connect with the other set or to terminals of a package being tested. A handler inserts the packages one at a time into the contact assembly and moves the movable set of contacts into circuit engagement with the package, and then the package is tested by the test circuit. The handler removes the package from the contact assembly and allows the movable set of contacts to engage the other set so that the standard circuit can be tested to verify that the test circuit is functioning correctly. Base data taken on the standard circuit is used to establish a significance band and data periodically taken on the standard circuit is compared with the significance band to determine the amount of drift in the test circuit.