The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 1995

Filed:

Feb. 03, 1993
Applicant:
Inventor:

Kenneth I Schultz, Somerville, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
128665 ; 128633 ; 128664 ; 2503581 ; 356432 ;
Abstract

A system for optically imaging a specimen is provided, which system amplitude modulates an optical signal with a longer wavelength signal, and in particular a signal having a wavelength which is much longer than any dispersive phase shift in the sample. The modulated optical signal is passed through the specimen. Scattered radiation in the optical output from the sample is filtered out and the resulting optical signal is detected and processed to obtain amplitude/absorption and phase/dispersion information, which information may be used in imaging. Optical signals at different frequencies may be passed through the same sample of the specimen to obtain additional information.


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