The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 1995
Filed:
Jan. 14, 1994
Jan Neumann, Huttenberg, DE;
Leitz Messtechnik GmbH, Wetzlar, DE;
Abstract
A method for compensating sliding temperature influences on workpieces during a dimensional measurement process. For this purpose, the workpiece temperature and the relative position of the workpiece in relation to the measuring apparatus are recorded at the start and at the end of the actual measurement. By use of the recorded values, the temperature of the workpiece can be calculated at each instant of the dimensional measurement and the relative position of the workpiece in relation to the measuring apparatus and therefore the corrected scanning point can thus be determined. Thus, in the dimensional measurement of workpieces, while taking into account the temperature influences, the temperature straight line in the time interval from the start of measurement to the end of measurement is divided by intermediate measurements into part intervals, within which interpolation can be carried out. For a further improvement of these values, the instants of coordinate measurement are made to coincide with the instants of temperature measurement.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile