The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 1995
Filed:
Mar. 24, 1994
Kazutoshi Takagi, Tokyo, JP;
Nobuaki Kitajima, Tokyo, JP;
Kabushiki Kaisha TOPCON, Tokyo, JP;
Abstract
According to the invention, in an operation microscope comprising an illumination optical system for irradiating an observation object, a recording optical system for receiving the reflected light from an observation object for recording and an observation optical system for receiving the reflected light from an observation object for observation, there is disposed a light dividing penetration member wherein an optical axis of the recording optical system and at least part of an optical axis of the illumination optical system coexist. In this operation microscope, due to the light dividing penetration member, the optical axis of the recording optical system and at least part of the optical system of the illumination optical system are arranged coaxially, so that the reflected light from the region of an observation objective irradiated with the illumination optical system always penetrates through the light dividing penetration member and continues through the recording optical system, is provided for recording. Accordingly, the angles between the respective optical axes become small, so even when an observation object exists at the bottom of a deep hole, its image can be recorded with certainty.