The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 1995
Filed:
Jan. 19, 1993
Stephen Wolf, Nederland, CO (US);
Stephen D Voran, Boulder, CO (US);
Arthur A Webster, III, Longmont, CO (US);
Other;
Abstract
A method and apparatus for objectively measuring the image quality of a destination video signal generates measurement parameters that are indicative of human image quality perceptions. Subjective human test panel results are generated for a variety of test scenes and types of image impairment. Objective test results are also generated by the apparatus of the present invention for the variety of test scenes and image impairments. A statistical analysis means statistically analyzes the subjective and objective test results to determine operation of the apparatus. Accordingly, when the apparatus extracts test frames from the actual source and destination video signals and compares them, image quality parameters are output by the apparatus which are based on human image quality perceptions.