The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 1995
Filed:
Dec. 15, 1993
Stanley M Reich, Jericho, NY (US);
Michael Horn, Setauket, NY (US);
Grumman Aerospace Corporation, Bethpage, NY (US);
Abstract
A method of magneto-optic eddy current imaging for detecting defects in a ferrous metal, non-ferrous metal, or non-metallic structure test object uses a sensor, magnetic field system, optical system, a video camera and a display. The method includes canceling undesired background of a two-dimensional magneto-optically generated image of a defect in the test object by dithering the image and processing signals from the video camera in compatibility with the dithering. The image is dithered once per frame of the camera, or at a sub-multiple of the frame of the camera, and the dithering may be accomplished manually or mechanically.