The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 1995
Filed:
Dec. 18, 1992
Paul S Rotker, West Newton, MA (US);
Nicholas A Warchol, Boxborough, MA (US);
Digital Equipment Corporation, Maynard, MA (US);
Abstract
A method of testing an integrated circuit having a plurality of pins includes the steps of providing a functional test set having an ordered group of test strings wherein each element of the test string is related to one of the pins of said integrated circuit. The group of test strings is searched to locate a sequence of test strings having a undesirable pattern. The undesirable pattern can be a pattern in which none of the elements associated with the test string changes or a pattern in which a reference element and at least one other element of the test string changes. When a sequence of test strings having the undesirable pattern is located, the group of test strings is processed to correct the undesirable pattern. When all the vector sequences having an undesirable patterns are corrected, the group of test vectors is applied to the input pins of the integrated circuit.