The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 1995
Filed:
Jun. 01, 1994
Shakeel Masood, Sunnyvale, CA (US);
Douglas G Gray, Santa Clara, CA (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
In a normal sector mark detection routine, using a wide open search window bits read from an optical data disk are searched for the presence of a sector mark pattern. Following detection of the pattern, using a search window of programmable width, a predefined region of the next sector is searched to locate a sector mark pattern. If the pattern is found, a sector mark found signal is generated. If the pattern is not found, a pseudo sector mark signal is generated. This sequence is repeated until either a subsequent sector mark pattern is detected, a predetermined number of pseudo sector mark signals generated or an exit command is received. Data is read from a sector in response to a sector mark found signal or pseudo sector mark signal. In a constant sector mark mode, the disk is searched, with the window wide open. Sector mark patterns are detected continuously to carry out media certification.