The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 1995

Filed:

Oct. 13, 1994
Applicant:
Inventors:

Katsuya Ono, Tokyo, JP;

Akira Hasegawa, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B / ; G02B / ;
U.S. Cl.
CPC ...
359708 ; 359709 ; 359722 ; 359723 ; 359738 ; 348342 ;
Abstract

An electronic image pickup apparatus comprising an imaging optical system for forming images of an object and image pickup device having light receiving surface configured so as to sample the images at discontinuously distributed points. This image pickup apparatus functions to sample the images of the object formed by the imaging optical system while receiving the images on the light receiving surface of the image pickup device and output signals representing light intensities on the object side. Disposed in the imaging optical system is a refracting surface which produces the optical low pass effect and has a shape capable of exhibiting an effect to eliminate moire, for example, due to a fact that it includes a point on which differential coefficients of a function expressing a shape of the refracting surface are discontinuous.


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