The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 1995

Filed:

May. 26, 1993
Applicant:
Inventor:

Yukio Sakano, Fuchu, JP;

Assignee:

Ricoh Company, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358296 ;
Abstract

A closed-loop area detecting method includes the steps of: reading a dot matrix from bi-level image data, the dot matrix comprising a target dot and two or more contiguous dots contiguous to the target dot; performing a first pattern matching to detect whether a dot matrix coincides with one of a plurality of first patterns so as to set a first flag for each dot; performing a second pattern matching to detect whether a dot matrix coincides with one of a plurality of second patterns so as to set a second flag for each dot; repeating the above mentioned first and second flag setting so that the second flags for all the dots of the image data are set; and detecting a dot of the image data as lying in the inside of a closed-loop area when the second flag is set to a first value, and detecting a dot of the image data as lying on the outside of the closed-loop area when the second flag is set to a second value. An image processing apparatus utilizing the closed-loop area detecting method is also provided.


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