The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 1995
Filed:
Feb. 16, 1993
Toshiro Kobayashi, Anjo, JP;
Kazuhiro Yoshimura, Toyohashi, JP;
Akihiro Hayashi, Toyokawa, JP;
Yoshinobu Hosoi, Gamagori, JP;
Nobuyuki Yano, Okazaki, JP;
Nidek Co., Ltd., , JP;
Abstract
An optometric apparatus includes an operating table and a vision test chart displaying device provided internally within the operating table. An optical group, including a plurality of reflection-type optical elements, are disposed within the operating table. The optical group repeatedly reflects an optical image of the vision test chart projected from the vision test chart displaying device along an optical path within said operating table. A first deflecting optical element reflects the optical image of the vision test chart reflected by the reflection-type optical element group outside the operating table in a first direction. A second deflecting optical element then reflects the optical image of the vision test chart reflected by the first deflecting optical element in a second direction toward the examinee's eyes. A line of vision of the examinee in looking at the optical image reflected by the second deflecting optical element obliquely intersects a plane passing through the optical path defined by the optical group.