The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 1995
Filed:
Feb. 28, 1994
Itaru Tomisaki, Kanagawa, JP;
Toru Takeda, Saitama, JP;
Sony Corporation, Tokyo, JP;
Abstract
An offset amount measuring apparatus for measuring an offset amount resulting from an offset produced when a disk, which is provided with a plurality of clock mark signals recorded around each circular data track at physically regular intervals, is mounted by chucking on a disk apparatus, reading the clock mark signals from the circular data track with a head, is disclosed. The apparatus comprises time interval measurement means for measuring the time interval between clock mark reproduced signals output from the head while the head is positioned at a distance of a predetermined radius from the center of rotation of the disk, offset amount calculation means for obtaining the distance between a locus of the head traced on the disk when the same is rotated and the circular data track from the time interval between the clock mark reproduced signals measured by the time interval measurement means, and offset amount storage means for storing the distance obtained by the offset amount calculation means as the offset amount in relation to the angle of rotation of the disk. By the use of this apparatus, it is possible to measure the offset amount electronically without using a mechanical measuring instrument, and precisely without decreasing the disk capacity.