The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 1995

Filed:

Aug. 30, 1993
Applicant:
Inventor:

Masao Kitajima, Saitama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
436 46 ; 422 58 ; 422 66 ; 436 44 ; 436 49 ;
Abstract

A high speed analyzer for a dry analytical element comprising a movable sample tray onto which the dry analytical element is placed, a sample-pipetting apparatus which spots a plurality of samples onto the dry analytical element placed onto the movable sample tray, an incubator which dries the dry analytical element onto which the samples have been spotted, a reagent-pipetting apparatus which spots a plurality of measuring reagent solutions onto the dry analytical element which has already been dried and a measuring part which measures a plurality of the dry analytical elements wherein reaction proceeds or has already been finished, and evaporation-preventing members which are attached to the dry analytical element onto which the reagents have been spotted to prevent evaporation of moisture from the spotted parts, and a method for measuring a plurality of analytical items of samples using the same. By utilizing the above analyzer, a large number of samples can be analyzed in various analytical items simultaneously rapidly.


Find Patent Forward Citations

Loading…