The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 1995
Filed:
Jan. 10, 1994
Joseph C Awad, San Jose, CA (US);
James W Eldridge, San Jose, CA (US);
David G Foote, San Jose, CA (US);
Norman K Ouchi, San Jose, CA (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Storage media defect areas that are too large to be managed by ECC processing alone and sufficiently small that read/write head clock synchronization can be maintained over the defect area, are managed by a fill pattern recording scheme in which an offset register indicates the beginning of a defect area and a fill pattern is recorded over the defect area while ECC processing is halted. Data recording is resumed after the defect area is passed. In this way, the number of times sector skipping must be used for a storage media is reduced, thereby making more efficient use of the storage media surface area.