The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 1995

Filed:

Apr. 30, 1993
Applicant:
Inventor:

Zev Galel, Palo Alto, CA (US);

Assignee:

SeamX, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B / ; G06F / ;
U.S. Cl.
CPC ...
36447402 ; 82-111 ; 82118 ; 36447437 ; 36455102 ;
Abstract

Real time in-process data is collected to determine the contour and position of the interface between dissimilar layers of material. A control system is automatically programmed, based on the determined contour and position of the interface, to autonomously control the trajectory of a cutter through a conventional motion control system to separate the dissimilar layers of material. The motion control system controls the cutter movement through, for example, a conventional linear motion device including a servomotor, lead screw, and slidable carriage that holds the cutter.


Find Patent Forward Citations

Galel, Zev. (1995). Autonomous selective cutting method and apparatus (U.S. Patent No. 5442565). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5442565

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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