The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 1995

Filed:

Feb. 03, 1994
Applicant:
Inventors:

Bernard Durand, Pfastatt, FR;

Robert Enderlin, Morschwiller le Bas, FR;

Pierre Henry, Illzach, FR;

Assignee:

Superba, S.A., Mulhouse, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356429 ; 25055919 ; 356430 ;
Abstract

The present invention relates to a detector for measuring the characteristics of a linear product of very great length relative to its other dimensions, on a production machine or the like. The detector operates without contact with the linear product and is provided with at least one means (1) having zones (2 and 3) for measurement relative to a mean position of the moving filament (4) and measuring the variation of the complex morpho-dimensional and/or positional characteristics of the filament (4), this latter varying, either by vibrating movement, or by displacement induced by the mean position of the axis of movement. The invention is applicable to the field of the measurement of the characteristics of linear products of very great length.


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