The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 1995
Filed:
Nov. 13, 1992
Applicant:
Inventors:
David N Batchelder, London, GB;
Chunwei Cheng, Yorkshire, GB;
Assignee:
Renishaw PLC, Gloucestershire, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356301 ; 356326 ;
Abstract
A sample placed under a microscope is illuminated by light from a laser beam. Raman scattered light is passed back via a dichroic filter to various optical components which analyse the Raman spectrum, and thence to a CCD detector. The optical components for analysing the Raman spectrum include tunable dielectric filters in a filter wheel; a Fabry-Perot etalon; and a diffraction grating. These various components may be swapped into the optical path as desired, for example using movable mirrors, enabling the apparatus to be used very flexibly for a variety of different analysis procedures. Various novel analysis methods are also described.