The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 1995

Filed:

Jun. 01, 1994
Applicant:
Inventors:

Yi-ping Hung, Taipei, TW;

Yau-liang Tsai, Taipei, TW;

George J Yang, Taipei, TW;

Assignee:

Eerise Corporation, Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ; H04N / ;
U.S. Cl.
CPC ...
348190 ; 348180 ;
Abstract

A method and a system for testing a cathode ray tube (CRT) or like products such as a cathode ray tube monitor, using at least two electronic cameras which offer a stereo vision to read a locating pattern produced on the screen of a tested CRT, thereby a preparatory positioning process of the CRT relative to the electronic cameras is not necessary.


Find Patent Forward Citations

Hung, Yi-ping. (1995). Method and a system for testing a cathode ray tube or like products (U.S. Patent No. 5442391). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5442391

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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