The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 1995

Filed:

Sep. 22, 1993
Applicant:
Inventors:

George H Sutton, Jr, Cincinnati, OH (US);

Francis H Little, Cincinnati, OH (US);

Carl Granger, Jr, West Chester, OH (US);

Philip F Stapf, Cincinnati, OH (US);

Assignee:

General Electric Company, Cincinnati, OH (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
324242 ; 324219 ;
Abstract

A device for inspecting a component, such as a dovetail slot of a gas turbine engine or the like, includes an eddy current array circuit having an active face for positioning on the surface of the component during the inspection operation and a backing disposed on a face of the eddy current array circuit opposite to the active face. The eddy current array circuit and the backing are disposed over the operating face and expandable sides of an expandable bar. The expandable bar has a slot formed therein with interior side edges which narrow toward the operating face of the bar at a predetermined slope. An expanding wedge with angled sides is positioned to cause the angled sides to respectively matingly engage the interior sides of the slot to cause the exterior sides of the expandable bar to expand outwardly a greater distance as the wedge is pushed deeper into the slot to cause the eddy current array circuit into conformance with the shape of the surface being inspected.


Find Patent Forward Citations

Sutton, Jr, George. (1995). Eddy current array inspection device (U.S. Patent No. 5442286). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5442286

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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