The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 1995
Filed:
May. 27, 1994
Wen-Wei Chiang, San Jose, CA (US);
Chih-Kung Lee, Taipei, TW;
International Business Machines Corporation, Armonk, NY (US);
Abstract
An optical measurement system for use in a data recording disk drive includes wavefront reconstruction optics which correct and compensate for aberrations in laser beams reflected from radial and linear diffraction gratings. The reconstruction optics include two spherical lenses and two reflectors, one of each positioned on each side of a diffraction grating. Light directed from a laser beam toward the grating diffracts into a +1 order component directed at the first set of reconstruction optics and into a -1 order component directed at the second set of reconstruction optics. The reconstruction optics compensate for the variable yaw angle caused by a linear grating and for the optical wavefront aberrations caused by a radial grating. Use of the reconstruction optics permits an optical measurement system in a data recording disk drive to accurately measure the position of either a linear or rotary actuator and to generate a precise reference clock for use in timing the recording of servo information to the data recording disk.