The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 1995
Filed:
Mar. 22, 1994
Takashi Hieda, Nagoya, JP;
Yoshio Yokoyama, Anjo, JP;
Nippondenso Co., Ltd., Kariya, JP;
Abstract
An image processing system for inspection of an over-printed matter having at least first and second layers different in lightness under appropriate illumination, wherein a digital image of the surface of the overprinted matter is formed, first and second reference images representing each normal image of the first and second layers are memorized, a first deviation between a first boundary of the first reference image to the second reference image and a portion of the digital image corresponding with the first boundary is measured, a second deviation between a second boundary of the second reference image to the first reference image and a portion of the digital image corresponding with the second boundary is measured, the first reference image is corrected to a first corrected reference image in such a manner as to eliminate the measured first deviation, the second reference image is corrected to a second corrected reference image in such a manner as to eliminate the measured second deviation, a finally corrected reference image is produced on a basis of logical sum of the first and second corrected reference images, and a matching process of the finally corrected reference image and the digital image is carried out for discrimination of the quality of the surface of the overprinted matter.