The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 1995

Filed:

Nov. 19, 1991
Applicant:
Inventors:

James W Roberts, Guelph, CA;

John G Elias, Wilmington, DE (US);

Graham A Jullien, Tecumseh, CA;

Assignees:

Dalsa, Inc., Waterloo, CA;

E. I. Du Pont de Nemours & Company, Wilmington, DE (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ; G01N / ;
U.S. Cl.
CPC ...
382-8 ; 356430 ; 348133 ; 348 88 ;
Abstract

A defect detection system includes a video camera with defect detection circuits for detecting defects in video signals being outputted by corresponding sections of an array sensor such as a TDI CCD two-dimensional array sensor. Each defect detection circuit includes a subtraction circuit for subtracting a prior stored pixel from an incoming pixel to generate a difference. Comparators compare the difference with positive and negative limits defining an acceptable range of difference values. The prior stored pixel is updated to the succeeding pixel only when the difference value is acceptable. Memories store the defect pixels from the respective detection circuits along with X-coordinates and end of line bits. The memories are sequentially read up to their end of line bits, and the defect pixel values along with coordinates expanded to include section indicating bits are transferred from the camera to further processing facilities.


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