The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 1995

Filed:

Apr. 14, 1993
Applicant:
Inventors:

Onofrio Schillaci, Camarillo, CA (US);

Ben Pierce, Oja, CA (US);

Steve R Coffelt, Simi Valley, CA (US);

Edward K Siu, Simi Valley, CA (US);

Assignee:

Harris Corporation, Melbourne, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04M / ; H04M / ; H04M / ;
U.S. Cl.
CPC ...
379 24 ; 379 27 ; 379 29 ; 379 34 ;
Abstract

The rate of change of a metallic subscriber loop charging characteristic and the period of time elapsed subsequent to the coupling of testing circuitry of a remote test unit coupled to the line are measured. The operation of the testing circuitry within the remote test unit is initiated in response to the rate of change of line voltage reaching a preselected rate of change, prior to the elapsed period of time reaching a prescribed time value. If the measured period of time reaches a prescribed value prior to the monitored rate of change of line voltage reaching the preselected rate of change, the last sampled value of the line voltage is stored and reported to a mechanized loop test system supervisory site.


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