The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 1995

Filed:

Jun. 13, 1994
Applicant:
Inventors:

Akihiro Miyamoto, Tokyo, JP;

Ryuichi Ikematsu, Tokyo, JP;

Haruhiko Matsunaga, Kanagawa, JP;

Hiromi Ueda, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ; H04B / ;
U.S. Cl.
CPC ...
371 204 ; 371 201 ; 371 682 ; 370 13 ; 370 14 ;
Abstract

In a test method and apparatus for testing a virtual path in an asynchronous transfer mode system, a sequence number is included in an operation administrating monitoring (OAM) cell to specify the OAM cell for testing a virtual path between transmission and reception sides. The sequence number is inserted into the OAM cell by the use of an idle cell and is received by a sequence number test circuit included in the reception side. The sequence number in the OAM is collated with a result of counting the OAM cell in the reception side to detect coincidence or non-coincidence between the sequence number and the result of counting. On detecting the non-coincidence, a loss of the OAM cell or wrong reception of the OAM cell is detected on the reception side. Otherwise normal operation is confirmed between the transmission and the reception sides.


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