Semiconductor memory device

Abstract

A semiconductor memory device has a first control signal is externally input to an input buffer circuit. A second control signal output from the input buffer circuit is input to an internal circuit. The internal circuit comprises a memory cell array having a number of memory cells and peripheral circuits for writing and reading cell information in and from the memory cells, and the writing and reading operations are executed based on the second control signal. Read data output from the internal circuit is input to an output buffer, which outputs the read data as output data. Power from a common power supply is supplied to the input buffer circuit and the output buffer. A noise-remove signal generator, which is connected to the input buffer circuit, functions based on either one of the first control signal and the second control signal to generate a noise remove signal in synchronism with an output timing of the output data. A noise removing circuit removes noise from the second control signal based on the noise remove signal.