The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 1995

Filed:

Apr. 25, 1994
Applicant:
Inventors:

Pierino I Zappella, Garden Grove, CA (US);

William R Fewer, Diamond Bar, CA (US);

Assignee:

Rockwell International Corporation, Seal Beach, CA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; C25D / ; H01C / ; H01C / ;
U.S. Cl.
CPC ...
324757 ; 205123 ; 257419 ;
Abstract

The invention uses transferable solder bump connection techniques in combination with a disposable test board to test and burn-in 'as received' (i.e., untested) dies. Using transferable solder bumps, a die is first attached to the top of a disposable test board. The test board can be designed to allow 100% functional testing of the die as well as burn-in. Dies that successfully complete the test and burn-in process are considered to be 'known good dies.' Next, heat is applied to remove the known good die from the test board. A property of the invention is that solder bumps transfer with the die such that it can be used immediately in a flip-chip configuration and affixed to a MCM or other circuit board.


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