The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 1995
Filed:
Apr. 04, 1994
Steffen Goerlich, Jena, DE;
Wolfgang Merker, Jena, DE;
Peter Voigt, Jena, DE;
Norbert Klose, Graitschen, DE;
Klaus Moehr, Eisenberg, DE;
Joachim Wieser, Jena, DE;
Jenoptik GmbH, Jena, DE;
Abstract
A method and arrangements for determining an at least approximately circular contacting surface is disclosed. The primary object of finding a simple way of objectively determining the contacting surface of a deformable medium on a plane surface with high accuracy and at a low technical expense is met according to the invention in that a film waveguide is used as a plane surface. An incoherent, parallel, homogeneous bundle of light whose width widens one-dimensionally is coupled into this film waveguide and the decoupled light is fed to a photoreceiver array for recording one-dimensional intensity distributions. An evaluating unit generates a difference curve from a normal curve without contacting medium and from a measurement curve with contacting medium and the exact diameter of the contacting surface is determined from the distance of two associated extremes of the difference curve. The method and arrangements are preferably used in ophthalmology for the measurement of the applanation circle at the tonometer and for measuring liquid drops for the purpose of analysis.