The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 1995

Filed:

Dec. 02, 1988
Applicant:
Inventor:

Michael Kontorovich, Colchester, VT (US);

Assignees:

Bio-Tek Instruments, Inc., Winooski, VT (US);

Syva Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
436 50 ; 422 63 ; 422 66 ; 422 67 ; 422105 ; 436 44 ; 436 46 ; 436 49 ; 436 55 ; 436164 ; 436172 ;
Abstract

A method of distinguishing between strips for different assays in an automated instrument, wherein characteristics to which the instrument is sensitive are selectively introduced in microwells of individual microstrips which are pretreated with a specific antigen or antibody for a particular test. On each microstrip, the wells having the characteristic collectively define a multi-bit code which corresponds to a particular condition or disease to be tested for. The automated instrument reads the characteristic from the selected wells and thus determines what test is to be conducted. The marks may have optical, radioactive, luminescent, fluorescent, or magnetic characteristics, in accordance with the test to be conducted.


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