The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 1995
Filed:
Dec. 22, 1993
Michael Reading, London, GB;
TA Instruments, Inc., New Castle, DE (US);
Abstract
The present invention is a modulated differential thermal analysis technique for determining the composition, phase, structure, identification, or other properties of a material that undergoes a transition as function of temperature or other driving variable. As applied to differential scanning calorimetric analysis (DSC), the preferred embodiment comprises (1) heating a sample of the material with a linear temperature ramp that is modulated with a sinusoidal heating rate oscillation; (2) simultaneously heating a reference at the same linear temperature ramp; (3) measuring the differential temperature of the sample and reference; and (4) deconvoluting the resultant heat flow signal into rapidly and non-rapidly reversible components.