The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 1995
Filed:
May. 23, 1994
Applicant:
Inventor:
Ryohei Kumagai, Tokyo, JP;
Assignee:
Ezel Inc., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382169 ; 382270 ; 358465 ; 358457 ;
Abstract
A dither processing method generates a binary-value image from an original image. The original image is converted to a binary-value image by a dither process. For each area in the dither image that corresponds to a dither cell, a representative density is calculated from the number of black (or white) pixels produced by the dither process. A median value of representative densities is then used as a threshold, and the original image is converted to a binary-value image using the threshold. By using the median of representative values, lighting of the original image is corrected.