The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 1995
Filed:
Feb. 23, 1995
David W Feldbaumer, Chandler, AZ (US);
Eric Maass, Mesa, AZ (US);
Motorola, Inc., Schaumburg, IL (US);
Abstract
A method for predicting yields for integrated circuit designs for given specification limits and process variations with respect to transistor parametric variations is based on a stastical analysis starting with response surface modeling techniques that relate desired circuit outcomes as a function of a set of defined independent variables. The response surfaces are converted to discrete C.sub.pk surfaces for all combinations of the independent variables. The C.sub.pk surfaces are next converted to discrete percent yield surfaces for each of the circuit outcomes which then are combined to provide a composite yield surface comprising all desired parametric operating points of the outcomes that may be used to predict the circuit yield.