The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 1995
Filed:
Nov. 12, 1993
Paul S Lee, La Palma, CA (US);
Pei-Ming D Chow, Los Angeles, CA (US);
John J Berenz, San Pedro, CA (US);
Jay S Pearlman, Rancho Palos Verdes, CA (US);
Wayne W Lam, Manhattan Beach, CA (US);
TRW Inc., Redondo Beach, CA (US);
Abstract
A focal plane imaging array (FPIA) (16) for use in a direct detection imaging device (10) for conducting radiometric imaging at microwave and millimeter-wave frequencies is disclosed as having an internal electronic calibration source (36). The plurality of energy detecting pixel elements (14) which comprise the FPIA (16) include a detection circuit (34) and a calibration circuit (36). The calibration circuit (36) is uni-directionally coupled to the detection circuit (34) to allow a known calibration signal 'pulse' to be introduced into the detection circuit (34). The calibration pulse is processed by the pixel detection circuit and the output signal is compared with the pixel's responsivity value. Adjustments in the pixel gain and sensitivity may then be made as appropriate.