The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 01, 1995
Filed:
May. 09, 1994
Applicant:
Inventors:
Jeffrey A Craig, Raleigh, NC (US);
Ka-Chiu Woo, Hopewell Junction, NY (US);
Assignee:
International Business Machines Corporation, Armonk, NY (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ; G01R / ;
U.S. Cl.
CPC ...
324537 ; 324519 ; 324677 ; 324711 ; 324718 ;
Abstract
A network-under-test of a device is tested relative to other networks of the device by probing the network-under-test with a probe; generating a voltage which is applied across the network-under-test via the probe for developing a transient voltage between the network-under-test and the other networks of the device for stressing leakage resistance between the network-under-test and the other networks; and determining if the stressed leakage resistance is acceptable for determining integrity of the network-under-test relative to the other networks of the device.