The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 01, 1995

Filed:

Jul. 09, 1993
Applicant:
Inventors:

Atsushi Nanjyo, Yokohama, JP;

Akiyoshi Kojima, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01R / ;
U.S. Cl.
CPC ...
324238 ; 324209 ; 324225 ; 324232 ; 324242 ; 324262 ;
Abstract

In order to improve product quality control through quantitative determination of a defect and quantitative judgement of the quality of a product, an alternating current is applied to a standard product coil into which is inserted a standard object, and to a test object coil into which is inserted a test object, and eddy currents are measured by means of a bridge circuit. If the test object coil is at a location removed from a flaw, the bridge circuit output voltage is zero, while if the test object coil is at the location of the flaw, a predetermined voltage is output. A determination of torsional breakage torque of the shaft inspection is carried out by correcting the output voltage for dependence on the cross sectional area ratio of the test object relating to the cross sectional area of the coil and for the influence of flaw size depending on the location.


Find Patent Forward Citations

Nanjyo, Atsushi. (1995). Method and apparatus for the nondestructive determination of torsional (U.S. Patent No. 5438262). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5438262

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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