The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 25, 1995
Filed:
Mar. 01, 1994
Atsushi Yokoyama, Kanagawa, JP;
Takayuki Yoshigahara, Tokyo, JP;
Sony Corporation, , JP;
Abstract
A distance measuring method and apparatus capable of achieving fast and precise measurement of distances to positions on the surface of a three-dimensional object. The measuring procedure comprises the steps of: calculating count values C.sub.1 and C.sub.2 indicative respectively of angle differences .theta..sub.1 and .theta..sub.2 of a scanning mirror where slit light reflected from a reference plane set at first, second and third positions S0, S1 and S2 is incident upon a predetermined one of sensing cells arranged on an image pickup plane; calculating a count value C.sub.x indicative of an angle difference between an angle .theta..sub.S2 of the scanning mirror where the slit light reflected from the reference plane at the third position thereof is incident upon the said cell on the image pickup plane, and another angle .theta..sub.SX of the scanning mirror where the slit light reflected from the surface of the object is incident upon the said cell on the image pickup plane; and executing a predetermined calculation to obtain the distance between the first position S0 and the object surface.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile