The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 1995

Filed:

Jun. 30, 1993
Applicant:
Inventors:

Hideaki Uemura, Tokyo, JP;

Yozo Tobo, Yokohama, JP;

Fumio Ichikawa, Kamakura, JP;

Masatoshi Kato, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B41J / ;
U.S. Cl.
CPC ...
346107 ; 372 31 ;
Abstract

There is disclosed a laser beam output optical unit adjustment method and apparatus, which can perform inspection and adjustment of a laser beam unit and a laser scanning optical system including this unit used in a laser beam printer within a short period of time. The laser irradiation position is roughly adjusted using a wide-field position detector, and focus rough adjustment is then performed using a narrow-field position detector. Thereafter, fine adjustment of the irradiation position and focus fine adjustment are performed using the narrow-field position detector. An image enhancement tube capable of a high-speed gate operation is arranged in a laser scanning region, and instantaneously takes a beam spot during laser scanning. An image processing devices analyzes the taken spot image, and a calculation unit calculates various data.


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