The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 25, 1995

Filed:

Oct. 15, 1993
Applicant:
Inventors:

Aharon Bornstein, Rishon Lezion, IL;

Stephen R Lowry, Madison, WI (US);

Assignee:

Nicolet Instrument Corporation, Madison, WI (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
25033912 ; 25033907 ; 25033911 ; 2503412 ; 2503418 ; 356300 ;
Abstract

A probe for use in attentuated total reflectance measurements in spectroscopy, such as Fourier transform infrared spectroscopy, is formed of an optical waveguide element having input and output sections and a loop between the two sections. The loop has a small radius of curvature and is exposed so that it can be contacted with a sample to obtain attenuated total reflectance measurements. The input and output sections may be retained in the bore of a thin walled tube with the loop forming a tip which extends from one end of the tube. The input and output sections of the optical waveguide element may be connected by couplers to a spectrometer to receive the output beam from and provide a return beam to the spectrometer. The tightly curved surfaces of the optical waveguide element at the loop result in multiple internal reflections as the beam of radiation traverses the loop. Attenuated total reflectance interactions occur between the beam of radiation and sample material in contact with the loop, which can comprise a liquid, a gas, or relatively soft solid materials.


Find Patent Forward Citations

Bornstein, Aharon. (1995). Optical probe for remote attenuated total reflectance measurements (U.S. Patent No. 5436454). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5436454

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…