The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 1995
Filed:
Apr. 19, 1993
Hiroshi Kumamoto, Nagaokakyo, JP;
Omron Corporation, Kyoto, JP;
Abstract
The present invention is carried out by modifying input data by the degree grade with respect to membership functions. The degree of fit measure is then used to obtain the information amount of each phenomena. A relational coefficient, which indicates the relatedness of a number of phenomena (for example, phenomena linked by an AND), is obtained. The degree of fit, information amount and relational coefficient are then used to determine the possibility of a conclusion. This scheme allows the user to enhance the accuracy of the information amount at the time the data are input. It also enables the user to attain an inference result with high discriminability based upon the relatedness of a number of phenomena with respect to a single conclusion. In another embodiment, the knowledge of expert users expressing the relationships between phenomena and conclusions is stored prior to use of the device. An inference device calculates the possibility of various conclusions and then calculates the clearnesses of the possibilities it has produced. As a result, the device exploits the user's knowledge that a single phenomenon for which a single conclusion is to be drawn may have two or more distinct definitions; and these may be conjoined in an OR relationship or conjoined in an AND relationship. The accuracy of inferences is thus improved and the area in which inferences are applied is broadened.