The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 1995
Filed:
Aug. 28, 1992
Hidetsugu Maekawa, Kadoma, JP;
Yasuharu Shimeki, Suita, JP;
Kazuhiro Kayashima, Hirakata, JP;
Hisao Niwa, Osaka, JP;
Seiichi Shin, Tsukuba, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
A test pattern generating apparatus for generating test patterns to test a sequential circuit having at least one memory element. The apparatus calculates, in response to a primary input applied to the sequential circuit, analog logic values for signal lines in the sequential circuit using a nonlinear function, then stores history data for the analog logic values with an inverse covariance matrix of the analog logic values. The apparatus then calculates an evaluation value according to the degree of variance between the analog logic values and the history data. A primary input setting unit is used for producing a next primary input which provides a maximum evaluation value from the evaluation value obtained from the present primary input. inputs produced by the primary input setting unit.