The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 1995
Filed:
Jun. 08, 1993
Koji Matsumoto, Tokyo, JP;
Ezel Inc., Tokyo, JP;
Abstract
The present invention provides a method of detecting the inclination of an IC to determine its position for arranging the sides of the IC parallel to an X-axis and Y-axis speedily and precisely without using image information of binarized images or an image of each pin. This method includes the steps of: inputting an image of an IC; defining a plurality of checking areas at predetermined positions in the image, wherein each checking area includes open ends of a plurality of IC pins; generating a density projection along a direction parallel to IC pins in each checking area; detecting the maximum value of a primary differential at the open ends of the IC pins; defining a representative point at a predetermined position on a line along the open ends; and calculating inclination of the IC according to the inclination of a reference line connecting the representative points of the checking areas.