The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 18, 1995
Filed:
Dec. 02, 1993
Seiichiro Tabata, Hachiouji, JP;
Hiroyuki Kurita, Hachiouji, JP;
Susumu Takahashi, Hachiouji, JP;
Katsunori Sakiyama, Akikawa, JP;
Toshikazu Takayama, Hachiouji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
The measuring endoscope includes a device for producing interference fringes, a device for projecting the interference fringes onto a surface of an object to be measured, a device for scanning the interference fringes, an imaging device for reading vibrations of brightness on the surface of the object to be measured which are caused by the scanning of the interference fringes and a processing device capable of determining depths of concavities and heights of convexities on the surface the measured object by calculating data output from the imaging device. This measuring endoscope makes it possible to determine accurately the location of internal diseases within organs of human bodies, defects in gas pipes and so on.