The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 18, 1995

Filed:

Feb. 25, 1994
Applicant:
Inventors:

Bartholomeus G Dillen, Eindhoven, NL;

Rudolph M Snoeren, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
2505593 ; 2502081 ;
Abstract

Accurately aligning opto-electronic image sensors with respect to a beam-splitter being comprised in an image sensing device is facilitated by incorporating an alignment pattern in the conductive metal stripes of the opto-electronic image sensors. When simultaneously viewed through the input face of the beam-splitter, alignment patterns of respective opto-electronic image sensors form a combined alignment patterns showing the accuracy of the alignment of the opto-electronic image sensors. By providing differences between pitches of the alignment patterns on either side of an axis of reflection, a combined alignment pattern is obtained showing various types of alignment errors, such as horizontal or vertical translation, or rotations. Quantification of alignment errors is facilitated by making use of vernier action in the combined alignment pattern.


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